Description
The techniques and methods that can be applied to materials characterization on the micro-scale are ubiquitous and well-established. Providing an overview of the physical principles of various methods, this book explores how new and old techniques can be brought to bear together on the interrogation of nanotechnology systems of great current interest. The authors focus on the needs in the research laboratory but also address the needs of quality control, industrial trouble shooting, and online analysis. Describing the operational modes most relevant to nanoscale characterization, the text also offers unique content on systems of different dimensionalities and functionalities.
